Test Finger Probe

IEC 60529 IP4X 1mm Test Probe D with 1N Force

The IEC 60529 IP4X 1mm Test Probe D with 1N Force is a standardized access probe used for IP4X ingress protection testing to verify protection against access to hazardous parts. It ensures that solid objects with a diameter of 1.0 mm cannot access live or hazardous components inside electrical enclosures.

This test probe is widely applied in type testing, routine inspection, and conformity assessment of electrical and electronic equipment.

Brand: SZBONAD

Product Number: BND-D

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IP4X Access Probe D (1 mm) According to IEC 60529

Standards & Compliance

  • IEC 60529 – Degrees of protection provided by enclosures (IP Code).
  • IEC 61032 – Protection of persons and equipment by enclosures (Access Probes).
  • Applicable for IP4X protection tests.

The probe is applied with a standardized test force of 1 N, as specified by the relevant IEC standards.

Applications

  • Electrical enclosures and cabinets
  • Industrial control panels
  • Switchgear and distribution equipment
  • Household and similar electrical appliances
  • Compliance testing laboratories
  • Certification and inspection bodies

Key Features

  • Precision-machined 1.0 mm diameter access probe.
  • Standardized 1 N test force.
  • Fully compliant with IEC 60529 and IEC 61032.
  • Consistent dimensions for repeatable test results.
  • Suitable for use with force gauges and standard IP test setups.
  • Designed for laboratory and certification use.

Technical Parameters:

Model Item name Standatds Parameters Pictures:
BND-D test rod/
test probe D,
1.0 mm diameter
IEC61032
IEC60335
IEC60529
Test Probe Length:100mm
Test Probe Diameter:1.0mm
Dam-sphere Diameter:35mm
Handle Diameter:10mm
Handle Length:100mm
IEC 60529 IP4X 1mm Test Probe
BND-DF test rod/
test probe D with 1N force
Test Probe Length:100mm
Test Probe Diameter:1.0mm
Dam-sphere Diameter:35mm
Handle Diameter:10mm
Handle Length:100mm
Force:1N
IEC 60529 IP4X 1mm Test Probe with 1N Force

Tests for protection against solid foreign objects indicated by the first characteristic numeral specified in IEC60529.

First No. Addit. Letter Access Probe test force
4,5,6 D IEC 60529 IP4X 1mm test rod D with 1N - Standard drawing 1N±10%

How the IP4X Test Is Performed

During IP4X testing, the 1 mm Test Probe D is applied to all relevant openings of the enclosure using a force of 1 N.
The enclosure meets the IP4X requirement if the probe cannot access hazardous parts inside the enclosure during the test.

Acceptance condition:

Table 7 – Test means for the tests for protection against solid foreign objects

Table 7 – Test means for the tests for protection against solid foreign objects

Acceptance conditions for first characteristic numerals 3, 4:

The protection is satisfactory if the full diameter of the probe specified in table 7 does not pass through any opening.

NOTE:

For the first characteristic numerals 3 and 4 the probes specified in table 7 are intended to simulate foreign objects which may be spherical.
Where an enclosure has an indirect or tortuous entry path and there is any doubt about ingress of a spherical object capable of motion,
it may be necessary to examine drawings or to provide special access for the object probe to be applied with the specified force to the opening(s)
where ingress has to be checked.

IP4X 1mm Test probe D with 1 N force

IEC 60529 IP4X Test Probe D with 1N Force

 

IP4X 1mm Test probe D without force

IEC 60529 IP4X 1mm Test Probe

Why Choose BONAD for IP4X Test Probe D

  • Manufactured to the specified 1.0 mm diameter and 1 N test force for accurate and repeatable IP4X access protection testing.
  • Precisely controlled probe tip and shaft dimensions reduce uncertainty during ingress protection tests.
  • Designed for use with force gauges and IEC 60529 / IEC 61032 test procedures.
  • Suitable for type testing, routine inspection, and conformity assessment of electrical enclosures.
  • BONAD is a manufacturer supplying products in accordance with IEC compliance testing requirements.

FAQ

What is an IP4X Test Probe D?

An IP4X Test Probe D is a standardized 1 mm access probe specified in IEC 60529 and IEC 61032, used to verify protection against access to hazardous parts.

What is the purpose of the 1N test force?

The 1 N test force ensures the test is performed under consistent and repeatable conditions, as required by IEC standards, when assessing access protection of electrical enclosures.

Which standards does this test probe comply with?

This test probe complies with IEC 60529 for IP codes and IEC 61032 for access probes, making it suitable for IP4X protection tests.

What types of equipment are tested using IP4X Test Probe D?

It is commonly used for testing electrical enclosures, control panels, switchgear, and household or similar electrical appliances requiring IP4X compliance.

Is IP4X Test Probe D the same as a finger probe?

No. IP4X Test Probe D is a 1 mm access probe and is different from finger probes (such as Probe A or B), which are used for other protection tests.

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