Test Finger Probe

IEC 60529 IP2X Jointed Test Finger Probe B

Jointed finger probe is mainly manufactured for testing the protection against access to hazardous parts. It is a high-precision probe, which simulates human finger movement.it can be with 10-50N force if necessary.

Brand: SZBONAD

Product Number: BND-B

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IEC 60529 IP2X Jointed test finger probe B with 50N froce

Technical Parameters:

Model Item name Standatds Parameters Pictures:
BND-B Jointed test finger probe B without force IEC61032

IEC60950

IEC60335
IEC60529

IEC60045  IEC60884
IEC60745

Knurled Finger Diameter:12mm

Knurled Finger Length:80mm

Baffle Plate Diameter:50mm

Baffle Plate Length:100mm

Baffle Thickness:20mm

IEC 60529 IP2X Jointed test finger probe B - Without thrust 3
BND-BF Jointed test finger

probe B with force

(10N,20N,30N,40N,50N)

Knurled Finger Diameter:12mm
Knurled Finger Length:80mm
Baffle Plate Diameter:50mm
Baffle Plate Length:100mm
Baffle Thickness:20mm
IEC 60529 IP2X Jointed test finger probe B - With thrust 1

Tests for protection against solid foreign objects indicated by the first characteristic numeral specified in IEC60529.

First No. Addit. Letter Access Probe test force
2 B IEC 60529 IP2X finger probe B standard drawing 1 10N±10%

Acceptance condition:

The protection is satisfactory if adequate clearance is kept between the access probe andhazardous parts.

in the case of the test for the additional letter B, the jointed test finger may penetrate to its 80 mm length, but the stop face (Ф50 mm x 20 mm) shall not pass through the opening. Starting from the straight position, both joints of the test finger shall be successively bent through an angle of up to 90 with respect to the axis of the adjoining section of the finger and shall be placed in every possible position.IEC 60529 IP2X finger probe B standard drawing 2

Material: metal, except where otherwise specified

Linear dimensions in millimetres

Tolerances on dimensions without specific tolerance:

on angles: 0/-10°

on linear dimensions.

up to 25 mm: 0-0.05over 25 mm: +0,2

Both joints shall permit movement in the same plane andthe same direction through an angle of 90° with a 0 to +10°tolerance.

Pictures of jointed test figner:

IEC 60529 IP2X Jointed test finger probe B - Without thrust 1
IEC 60529 IP2X Jointed test finger probe B - With thrust 2

Frequently Asked Questions

What is an IP2X test finger probe (Test Probe B)?

An IP2X test finger probe (Test Probe B) is a standardized tool defined in IEC 60529 and IEC 61032. It simulates a human finger to verify that enclosures prevent access to hazardous parts.

What does IP2X protection mean?

IP2X means the enclosure prevents access to dangerous parts using a finger and blocks solid objects larger than 12.5 mm, ensuring basic user safety.

How is the IP2X test performed?

The jointed test finger is applied to openings with a standard force (typically 10N). The enclosure passes if the probe cannot touch hazardous parts and the stop plate does not enter.

What standards does this test probe comply with?

This test probe complies with major international standards, including IEC 60529, IEC 61032 (Test Probe B), and commonly used electrical safety standards such as IEC 60335 and IEC 62368.

Where is the IP2X test finger used?

It is widely used in electrical appliances, IT equipment, switchgear, and industrial enclosures to verify safety and compliance with ingress protection standards.

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