IEC 62368-1 R6mm Stainless Steel Blunt Test Probe Of Figure V.3 – BONAD TNV Circuit Safety Test Probe
Standards:
- Primary Standard: IEC 62368-1 Figure V.3 (Safety Standard for Audio/Video & IT Equipment)
- Additional Compatible Standards:
- UL 6500 Figure B.1
- IEC 60950-1 Figure 2C
Applications:
- TNV Circuit Protection Testing: Evaluates whether exposed TNV circuit parts have sufficient insulation or mechanical protection to prevent contact with hazardous live components.
- Safety Certification Testing: Used in IEC/UL/EN-certified laboratories to verify compliance with electrical shock, energy hazard, and other safety requirements.
Features:
- Precision Compliance: Strictly adheres to IEC 62368-1 Figure V.3 specifications, with a 6mm blunt tip for accurate and reliable test results.
- Multi-Standard Compatibility: Meets requirements of UL 6500, IEC 60950-1, and other global safety standards.
- Durable Construction: Made of high-strength insulating materials, the handle and stop face are nylon, the tip is stainless steel, resistant to wear and corrosion, ideal for high-frequency lab use.
- Safe & Efficient Design: Blunt tip minimizes accidental damage to tested devices, enhancing operational safety.
- Global Applicability: Widely used by certification bodies, electronics manufacturers, and third-party testing labs worldwide.
Technical parameters:
| Test probe diameter | 12 mm |
| Test probe length | 80 mm |
| Baffle plate thickness | 5 mm |
| Baffle plate diameter | 50 mm |
| Probe material | Stainless steel |
| Handle material | Nylon |
