IEC 60529 IPXXB Test Finger Probe

IEC 60529 IPXXB Test Finger Probe – BONAD Insulated Handle Test Finger

Standards:

• Primary Standard: IEC 61032 Fig. 2 Probe B
• Key Applications:
  • IEC 60529 (IP Code Testing)
  • IEC 61851-1 (EV Conductive Charging Systems)
  • UL/EN/IEC 62368-1 (Audio/Video & IT Equipment)
  • ISO 20653 (Road Vehicles IP Protection)

Applications:

1. IPXXB/IP2X Verification: Tests openings in enclosures for finger access to hazardous parts.
2. EV Charger Safety: Mandatory for IEC 61851-1 compliance (AC/DC charging stations).
3. Industrial Equipment: Control panels, machinery guards, switchgear IP rating validation.
4. Consumer Products: Appliances, sockets, and lighting fixtures requiring child safety certification.

Features:

Anatomically Accurate Design

• Simulates 4-year-old’s finger: 12±0.1mm diameter × 80±0.2mm length
• Dual 90° adjustable joints replicates natural finger articulation

Full Regulatory Compliance

• Traceable to IEC 61032 Probe B (calibration certificate included)

Safety-Optimized Construction

• 1kV insulated handle (120mm length) for operator protection
• Stainless steel joints – corrosion-resistant, zero deformation under 20N force

Testing Efficiency

• Integrated design: Joint assembly + probe + base + handle (ready to use)
• 20N±1N standardized test force for consistent results

Cross-Industry Compatibility

• Supports IP ratings (IEC 60529), EV charging (IEC 61851), and equipment safety (IEC 62368) tests

Technical parameters:

Model	BND-IBTP
Name	Standard test finger
Joint 1	30±0.2 (mm)
Joint 2	60±0.2 (mm)
Finger length	80±0.2 (mm)
Fingertip to baffle	180±0.2 (mm)
Cylindrical	R2±0.05 (mm)
Spherical	S4±0.05 (mm)
Fingertip cutting bevel angle	37o 0 -10’
Fingertip taper	14 o 0 -10’
Test finger diameter	Ф12 0 -0.05 (mm)
A-A Section diameter	Ф50 (mm)
A-A Section width	20±0.2 (mm)
Baffle diameter	Ф75±0.2 (mm)
Baffle thickness	5±0.5 (mm)